Data collections were performed at the X-ray diffraction beamline (XRD1) of the Elettra Synchrotron of Trieste (Italy), equipped with a Pilatus 2M image plate detector.
Collection temperature was 100 K (nitrogen stream supplied through an Oxford Cryostream 700); the wavelength of the monochromatic X-ray beam was 0.700 Å and the diffractograms were obtained with the rotating crystal method.
The crystals were dipped in N-paratone and mounted on the goniometer head with a nylon loop. The diffraction data were indexed, integrated and scaled using XDS [kabsch:2010].
The structures were solved by the dual space algorithm implemented in the SHELXT code [shelxt]. Fourier analysis and refinement were performed by the full-matrix least-squares methods based on F2 implemented in SHELXL [shelxl]. The Coot and SHELXLE programs were used for modeling [coot,shelxle].
For the refinement of the crystal structure of complex [ka76], anisotropic thermal motion was allowed for all non-hydrogen atoms. Hydrogen atoms were placed at calculated positions with isotropic factors U=1.2×Ueq, Ueq being the equivalent isotropic thermal factor of the bonded non hydrogen atom.
The refinement of the X-ray data for the complexes [ka89_f2] and [ka104] and for the ligand of complex [ka89_f2] are still under work: in the ORTEP representations showed in this thesis thermal motion is thus represented isotropically.
| [kabsch:2010] | W. Kabsch, Acta Cryst. D, 66 (2010) 125—132 |
| [shelxt] | G. M. Sheldrick, Acta Cryst. A 72 (2015) 3—8 |
| [shelxl] | G. M. Sheldrick, Acta Cryst. 64 (2008) 112—122 |
| [coot] | P. Emsley, K. Cowtan, Acta Cryst. D 60 (2004) 2126—2132 |
| [shelxle] | C. B. Hübschle, G. M. Sheldrick, B. Dittrich, Journal of Applied Crystallography, 44 (2011) 1281—1284 |